Takamitsu MIYAJI
(IA-UNAM Ensenada)
Stacking analysis is a strong tool for investigating faint emission from objects, which are not detected in X-ray as individual sources. We have developed an easy-to use tool to make this analysis in a number of Chandra survey field, including C-COSMOS, COSMOS Legacy, CDF-S and N, E-CDFS, AEGIS-XD, X-UDS and the AKARI NEP Deep Field. I explain the use and functions of the latest version V4.32. (http://lambic.astrosen.unam.mx/cstack) and introduce some scientifc results obtained using the tool.